SIPO survey shows patent examination quality improved

The result of survey on the satisfaction degree of patent examination quality launched by the State Intellectual Property Office (SIPO) for the year 2009 indicated that, the satisfaction degree was 79.4, beter than 77.3 in 2008. Besides, the satisfaction degree of the public to other testing indexes related to examination quality was also improved and the complaint index notably decreased while the confidence index increased.

Patent examination quality okeyed

It is introduced that the satisfaction degree to the correctness of examination result and procedure was 82.0, higher than 76.8 in 2008. The examination quality was okeyed by the interviewees.

Satisfaction degree to examination efficiency was marginally raised

It is learnt that the satisfaction degree to examination efficiency was 76, slightly higher than 75 in 2008. 64% of the interviewees could accept the preliminary examination period exceeding 6 months and merely 27% of them hoped to complete the preliminary examination within three months.

In the national phase, PCT examination efficiency overmatched foreign IP offices or organizations

The survey result showed that, for the examination efficiency of PCT applications entering national phase, 85.7% of the interviewees said that the time SIPO sent out the first notice was no later than that of the IP offices or organization of the United States, Japan and Europe.

SIPO determined to improve the examination quality continuously

The SIPO will continue to launch survey work on the satisfaction degree to examination quality, well know about social demand, raise examination efficiency and improve examination quality. [